Research on Automatic Test Method of RF Receiving Sensitivity for V2X On-Board Terminals Under Multi-Working Conditions
DOI:
https://doi.org/10.63593/IST.2788-7030.2026.09.002Keywords:
V2X, C-V2X, vehicle-mounted terminal, RF receiving sensitivity, multi-condition coupling, electromagnetic interference, channel fading, adaptive iterative algorithm, automatic testing, dynamic RF test, error suppressionAbstract
V2X is the foundational communication technology for intelligent connected vehicles. RF receiving sensitivity, a core metric evaluating terminals’ weak-signal demodulation and anti-interference capability, is critical for device calibration and performance assessment. Conventional static laboratory testing ignores coupled interferences including high-speed Doppler shift, multipath fading, on-board electromagnetic noise and extreme temperature, leading to large gaps between measured data and real-vehicle performance. Besides, manual testing suffers low automation, poor repeatability and limited scenario coverage. To solve these issues, this paper proposes a multi-condition adaptive automatic testing scheme for V2X receiving sensitivity. First, it analyzes vehicle interference mechanisms and builds a coupled sensitivity evolution model to quantify multi-factor RF attenuation. Second, an adaptive variable-step iteration algorithm is designed to balance test precision and efficiency for dynamic scenarios. Finally, a full closed-loop hardware-software test platform is developed to synchronously simulate diverse operating environments and automate signal acquisition & analysis. Simulations and hardware tests show that the proposed method cuts relative test error by 8.24% (Chen S, Hu J, Shi Y, et al., 2020), boosts testing efficiency by 67.3%, and restricts repeated test fluctuation within 1.1 dBm. It supports full-scene tests covering highway driving, urban occlusion, tunnels and extreme temperatures. This work fills theoretical and technical gaps in multi-condition V2X testing and offers theoretical support and engineering references for terminal optimization, standardized test system construction and large-scale V2X commercialization.
